Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding-Reference-Cited by-同舟云学术

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Efficient test data compression and decompression for system-on-a-chip using internal scan chains and Golomb coding

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Container-title:Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001
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Author:

Chandra A.,Chakrabarty K.

Publisher

IEEE Comput. Soc

Link

http://xplorestaging.ieee.org/ielx5/7307/19761/00915015.pdf?arnumber=915015

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. On don’t cares in test compression;Microprocessors and Microsystems;2014-11

3. Simulation and SAT Based ATPG for Compressed Test Generation;2013 Euromicro Conference on Digital System Design;2013-09

4. Binary Difference Based Test Data Compression for NoC Based SoCs;2012 IEEE Computer Society Annual Symposium on VLSI;2012-08

5. A Novel Technique for Input Vector Compression in System-on-Chip Testing;2008 International Conference on Information Technology;2008-12

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