Low frequency noise in thin film transistors-Reference-Cited by-同舟云学术

Low frequency noise in thin film transistors

Published:2002-02-01 Issue:1 Volume:149 Page:75-82
ISSN:1350-2409
Container-title:IEE Proceedings - Circuits, Devices and Systems
language:en
Short-container-title:

Author:

Rigaud D.,Rhayem J.,Valenza M.

Publisher

Institution of Engineering and Technology (IET)

Subject

Electrical and Electronic Engineering

Link

https://digital-library.theiet.org/content/journals/10.1049/ip-cds_20020063?crawler=true&mimetype=application/pdf

Reference44 articles.

1. Theoretical Analysis of Amorphous-Silicon Field-Effect-Transistors

2. Physics of amorphous silicon based alloy field‐effect transistors

3. Static and dynamic analysis of amorphous-silicon field-effect transistors

4. Rolland, A.: ‘Contribution a l'analyse physique du transistor couches minces a base de silicium amorphe hydrogene. Application a l'adressage d'ecrans plats a matrice active de transistors’, April, 1993, PhD, Rennes

5. Conduction and 1/f noise analysis in amorphous silicon thin-film transistors

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