Radiative defect state identification in semi-insulating GaAs using photo-carrier Radiometry
Author:
Publisher
IOP Publishing
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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1. Deep‐level spectroscopy in high‐resistivity materials
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4. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
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