Time-resolved laser scanning photothermal microscopy for characterization of thermal properties of semi-insulating GaAs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Time-resolved laser scanning photothermal microscopy for characterization of thermal properties of semi-insulating GaAs

Published:2020-04-01 Issue:8 Volume:28 Page:11393
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Dong Jingtao^ORCID,Zhang Tengda,Yang Lei,Yan Peizheng^ORCID,Zhang Yuzhong,Li Jingsong,Lei Zhang,Zhou Sheng^ORCID

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Open Fund of Key Laboratory of Opto-Electronic Information Acquisition and Manipulation of Ministry of Education

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference35 articles.

1. Thermal and plasma wave depth profiling in silicon

2. Plasma, thermal, and elastic waves in semiconductors

3. Thermoelectronic-wave coupling in laser photothermal theory of semiconductors at elevated temperatures

4. Carrier-density-wave transport property depth profilometry using spectroscopic photothermal radiometry of silicon wafers I: Theoretical aspects

5. Infrared photothermal radiometry of deep subsurface defects in semiconductor materials

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dual-wavelength Mach-Zehnder interferometry-assisted photothermal spectroscopy for characterization of surface contaminants;Optics Express;2020-09-21

2. Intensity dependent deflection spectroscopy for the characterization of absorption mechanisms in semiconductors;Journal of Applied Physics;2020-07-28

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP