Experimental investigation of self heating effect (SHE) in multiple-fin SOI FinFETs-Reference-Cited by-同舟云学术

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Experimental investigation of self heating effect (SHE) in multiple-fin SOI FinFETs

Published:2014-09-26 Issue:11 Volume:29 Page:115021
ISSN:0268-1242
Container-title:Semiconductor Science and Technology
language:
Short-container-title:Semicond. Sci. Technol.

Author:

Jiang Hai,Xu Nuo,Chen Bing,Zeng Lang,He Yandong,Du Gang,Liu Xiaoyan,Zhang Xing

Funder

the National Fundamental Basic Research Program of China

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0268-1242/29/i=11/a=115021/pdf

Reference25 articles.

1. Performance assessment of nanoscale double- and triple-gate FinFETs

2. Electrical characterization and design optimization of FinFETs with a TiN/HfO2gate stack

3. Heat Generation and Transport in Nanometer-Scale Transistors

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