Analysis of local electrical properties of grain boundaries in Si by electron-beam-induced-current techniques
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/14/i=48/a=364/pdf
Reference10 articles.
1. Influence of copper contamination on recombination activity of misfit dislocations in SiGe/Si epilayers: Temperature dependence of activity as a marker characterizing the contamination level
2. Recombination activity of contaminated dislocations in silicon: A model describing electron-beam-induced current contrast behavior
3. Scanning electron microscope charge‐collection images of grain boundaries
4. Theory of beam induced current characterization of grain boundaries in polycrystalline solar cells
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Grain boundary light beam induced current: A characterization of bonded silicon wafers and polycrystalline silicon thin films for diffusion length extraction;physica status solidi (a);2016-04-13
2. Charge Carrier Transport along Grain Boundaries in Silicon;Solid State Phenomena;2013-10
3. Dislocations as Active Components in Novel Silicon Devices;Advanced Engineering Materials;2009-04
4. Electrical Uniformity of Direct Silicon Bonded Wafer Interfaces;Solid State Phenomena;2007-10
5. Dislocations in Silicon as a Tool to Be Used in Optics, Electronics and Biology;Solid State Phenomena;2007-10
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3