Simulation-based study of current gain peaks h 21 at low gate bias in AlGaN/GaN HEMTs *

Author:

Kaushik Pragyey KumarORCID,Awasthi ShivanshORCID,Kumar NitishORCID,Goyal Umakant,Mishra Meena,Gupta Ankur,Basu Ananjan

Abstract

Abstract In this article, we have presented the effect of low gate bias on short circuit current gain h 21 beyond cutoff frequency in AlGaN/GaN HEMT. A small-signal model, based on its intrinsic and extrinsic parameter values, is simulated beyond the cutoff frequency to analyze its peak. From the study, it has been observed that the first peak of short circuit current gain has the resonance frequency as well as magnitude variation with respect to low gate voltages. Whereas, the second peak of the current gain h 21 has only magnitude dependency on low gate voltage with fixed resonance frequency. The relevance of this study is to provide a comprehensive insight to the circuit designer to efficiently consider these windows of current gain peak beyond the cutoff frequency into their design. For this analysis, we have taken AlGaN/GaN HEMT device with a channel length of 0.8 μm and 2 × 200 μm2 gate width. A measured S-parameter data up to 40 GHz at low gate bias is used to extract the model parameters.

Funder

Defence Research and Development Organization (DRDO), Government of India

Publisher

IOP Publishing

Subject

General Engineering

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. GaN HEMT Current-Gain Peak: An Insight into the Effects of the Bias Condition;2023 16th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS);2023-10-25

2. A Systematic and Numerical Methodology for GaN HEMT Current-Gain Peak Analysis Using the Complex Lorentzian Function;IEEE Microwave and Wireless Technology Letters;2023-07

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