Radiation-induced bending of silicon-on-insulator nanowires probed by coherent x-ray diffractive imaging
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
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2. X-ray ptychography on low-dimensional hard-condensed matter materials;Applied Physics Reviews;2019-03
3. Investigating Strain in Silicon-on-Insulator Nanostructures by Coherent X-ray Diffraction;Synchrotron Radiation in Materials Science;2018-02-16
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