Investigating Strain in Silicon-on-Insulator Nanostructures by Coherent X-ray Diffraction-Reference-Cited by-同舟云学术

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Investigating Strain in Silicon-on-Insulator Nanostructures by Coherent X-ray Diffraction

Published:2018-02-16 Issue: Volume: Page:239-274
ISSN:
Container-title:Synchrotron Radiation in Materials Science
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Author:

Xiong Gang¹,Moutanabbir Oussama²,Reiche Manfred³,Harder Ross⁴,Robinson Ian¹⁵

Affiliation:

1. University College London; London Centre for Nanotechnology; London WC1H 0AH UK

2. Ecole Polytechnique de Montreal; Department of Engineering Physics; Montreal QC H3C 3A7 Canada

3. Max Planck Institute of Microstructure Physics; Weinberg 2 06120 Halle (Saale) Germany

4. Advanced Photon Source, Argonne National Laboratory; Argonne IL 60439 USA

5. Condensed Matter Physics and Materials Science Department; Brookhaven National Laboratory; Upton NY 11973 USA

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference138 articles.

1. Generation of spatially coherent light at extreme ultraviolet wavelengths;Bartels;Science,2002

2. Measurement of the coherence of synchrotron radiation;Takayama;J. Synchrotron Radiat.,1998

3. Coherent X-ray scattering;Veen;J. Phys. Condens. Matter,2004

4. Slits as adjustable pinholes for coherent X-ray scattering experiments;Vlieg;J. Synchrotron Radiat.,1997

5. Preparation of a partially coherent focused X-ray beam within a planar X-ray waveguide;Bongaerts;J. Synchrotron Radiat.,2002

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