Slits as Adjustable Pinholes for Coherent X-ray Scattering Experiments

Author:

Vlieg E.,De Vries S. A.,Alvarez J.,Ferrer S.

Publisher

International Union of Crystallography (IUCr)

Subject

Instrumentation,Nuclear and High Energy Physics,Radiation

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Optical design of micro-focus X-ray photon correlation spectroscopy beamline at Shenzhen Light Source;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-03

2. Characterization of the X-ray coherence properties of an undulator beamline at the Advanced Photon Source;Journal of Synchrotron Radiation;2018-06-13

3. Investigating Strain in Silicon-on-Insulator Nanostructures by Coherent X-ray Diffraction;Synchrotron Radiation in Materials Science;2018-02-16

4. Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures;Advanced Materials;2014-06-23

5. A low-background-intensity focusing small-angle X-ray scattering undulator beamline;Journal of Applied Crystallography;2013-11-15

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