Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures-Reference-Cited by-同舟云学术

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Coherent X-Ray Diffraction Imaging and Characterization of Strain in Silicon-on-Insulator Nanostructures

Published:2014-06-23 Issue:46 Volume:26 Page:7747-7763
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Xiong Gang¹,Moutanabbir Oussama²,Reiche Manfred³,Harder Ross⁴,Robinson Ian¹

Affiliation:

1. London Centre for Nanotechnology; University College London; London WC1H 0AH United Kingdom

2. Department of Engineering Physics; Ecole Polytechnique de Montreal; Montreal Quebec H3C 3A7 Canada

3. Max Planck Institute of Microstructure Physics; Weinberg 2 06120 Halle (Saale) Germany

4. Advanced Photon Source; Argonne National Laboratory; Argonne Illinois 60439 USA

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/adma.201304511/fullpdf

Reference139 articles.

1. Generation of Spatially Coherent Light at Extreme Ultraviolet Wavelengths

2. Measurement of the coherence of synchrotron radiation

3. Coherent x-ray scattering

4. Slits as Adjustable Pinholes for Coherent X-ray Scattering Experiments

5. Propagation of a partially coherent focused X-ray beam within a planar X-ray waveguide

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