Transformation of the defect structure of InGaAs and InAlAs metamorphic buffer layers depending on indium concentration
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/1124/i=2/a=022027/pdf
Reference4 articles.
1. Lattice relaxation and misfit dislocations in nonlinearly graded InxGa1 − xAs/GaAs (001) and GaAs1 − yPy/GaAs (001) metamorphic buffer layers
2. Optimization of the Structural Properties and Surface Morphology of a Convex-Graded In x Al1–xAs (x = 0.05–0.83) Metamorphic Buffer Layer Grown via MBE on GaAs (001)
3. Peculiarities of strain relaxation in linearly graded InxGa1−xAs/GaAs(001) metamorphic buffer layers grown by molecular beam epitaxy
4. Complex use of the diffraction techniques in depth profiling of the crystal lattice parameter and composition of InGaAs/GaAs gradient layers
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