Author:
Baidakova M. V.,Kirilenko D. A.,Sitnikova A. A.,Yagovkina M. A.,Klimko G. V.,Sorokin S. V.,Sedova I. V.,Ivanov S. V.,Romanov A. E.
Subject
Physics and Astronomy (miscellaneous)
Reference7 articles.
1. U. Pietsch, V. Holy, and T. Baumbach, High-Resolution X-Ray Scattering. From Thin Films to Lateral Nanostructures (Springer-Verlag, New York, 2004).
2. H. Heinke, M. O. Moller, D. Hommel, et al., J. Cryst. Growth 135, 41 (1994).
3. P. B. Hirsh, A. Howie, R. B. Nicolson, et al., Electron Microscopy of Thin Crystals (Butterworths, London, 1965).
4. D. K. Bowen and B. K. Tanner, High Resolution X-Ray Diffractometry and Topography (Taylor and Francis, London, 1998).
5. P. F. Fewster, X-Ray Scattering from Semiconductors. 2nd ed. (Imperial College Press, London, 2003).
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献