Study of X-ray radiation damage in silicon sensors
Author:
Publisher
IOP Publishing
Subject
Mathematical Physics,Instrumentation
Reference10 articles.
1. Updated NIEL calculations for estimating the damage induced by particles and γ-rays in Si and GaAs
2. Estimating oxide‐trap, interface‐trap, and border‐trap charge densities in metal‐oxide‐semiconductor transistors
3. Dose Enhancement and Reduction in SiO$_{2}$ and High-$\kappa$ MOS Insulators
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