Updated NIEL calculations for estimating the damage induced by particles and γ-rays in Si and GaAs-Reference-Cited by-同舟云学术

Updated NIEL calculations for estimating the damage induced by particles and γ-rays in Si and GaAs

Published:2001-10 Issue:4 Volume:62 Page:301-310
ISSN:0969-806X
Container-title:Radiation Physics and Chemistry
language:en
Short-container-title:Radiation Physics and Chemistry

Author:

Akkerman A,Barak J,Chadwick M.B,Levinson J,Murat M,Lifshitz Y

Publisher

Elsevier BV

Subject

Radiation

Reference33 articles.

1. Akkerman, A.F., 1991. Modeling of Charged Particle Trajectories in Matter. Energoatomizdat, Moscow, 200p (in Russian).

2. Modeling of proton induced SEUs;Akkerman;Radiat. Phys. Chem.,1996

3. Akkerman, A.F., Grudskii, M.Ya., Smirnov, V.V., 1986. Secondary Electron Radiation from Solids Induced by γ-rays. Energoatomizdat, Moscow, 166p (in Russian).

4. Nuclear and damage effects in Si produced by irradiations with medium energy protons;Alurralde;IEEE Trans. Nucl. Sci.,1991

5. Scaling of SEU mapping and cross section, and proton induced SEU at reduced supply voltage;Barak;IEEE Trans. Nucl. Sci.,1999

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