Charge collection characterisation with the Transient Current Technique of the ams H35DEMO CMOS detector after proton irradiation-Reference-Cited by-同舟云学术

Charge collection characterisation with the Transient Current Technique of the ams H35DEMO CMOS detector after proton irradiation

Published:2018-10-01 Issue:10 Volume:13 Page:P10004-P10004
ISSN:1748-0221
Container-title:Journal of Instrumentation
language:
Short-container-title:J. Inst.

Author:

Anders J.,Benoit M.,Braccini S.,Casanova R.,Chen H.,Chen K.,Bello F.A. Di,Fehr A.,Ferrere D.,Forshaw D.,Golling T.,Gonzalez-Sevilla S.,Iacobucci G.,Kiehn M.,Lanni F.,Liu H.,Meng L.,Merlassino C.,Miucci A.,Nessi M.,Perić I.,Rimoldi M.,Sultan D M S,Pinto M. Vicente Barreto,Vilella E.,Weber M.,Weston T.,Wu W.,Xu L.,Zaffaroni E.

Publisher

IOP Publishing

Subject

Mathematical Physics,Instrumentation

Link

http://stacks.iop.org/1748-0221/13/i=10/a=P10004/pdf

Reference20 articles.

1. A novel monolithic pixelated particle detector implemented in high-voltage CMOS technology

2. Prototyping of an HV-CMOS demonstrator for the High Luminosity-LHC upgrade

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