Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
18 articles.
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1. A mathematical model for deep ion implantation depth profiling by synchrotron radiation grazing-incidence X-ray fluorescence spectrometry;Journal of Analytical Atomic Spectrometry;2020
2. Determination of molecular stopping cross section of 12C, 16O, 28Si, 35Cl, 58Ni, 79Br, and 127I in silicon nitride;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-10
3. Determination of the 9Be(3He,pi)11B (i=0,1,2,3) cross section at 135° in the energy range 1–2.5MeV;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-03
4. Accurate electronics calibration for particle backscattering spectrometry;Analytical Methods;2015
5. Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry;Analytical Chemistry;2012-07-02