Signal-to-noise ratio in the stroboscopic scanning electron microscope
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/18/i=7/a=014/pdf
Reference17 articles.
1. Comparison of the noise of different electron detection systems using a scintillator-photomultiplier combination
2. Electron beam testing: Methods and applications
3. Electron beam blanking systems
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