A statistical model of signal-noise in scanning electron microscopy
Author:
Affiliation:
1. JEOL Technics Ltd.; Akishima-shi; Tokyo Japan
Publisher
Wiley
Subject
Instrumentation,Atomic and Molecular Physics, and Optics
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.20282/fullpdf
Reference12 articles.
1. Comparison of the noise of different electron detection systems using a scintillator-photomultiplier combination;Baumann;Scanning,1981
2. Measurement of the statistics of secondary electron emission;Delaney;IEEE Trans Nucl Sci,1966
3. Factors affecting contrast and resolution in the scanning electron microscope;Everhart;J Electron Control,1959
4. Signal-to-noise ratio in the stroboscopic scanning electron microscope;Fujioka;J Phys E Sci Instrum,1985
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