On the relationship between the feedback charge method, charge transient spectroscopy and C-V measurements of semiconductors and insulators
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Link
http://stacks.iop.org/0957-0233/3/i=8/a=008/pdf
Reference5 articles.
1. Transient distortion and nth order filtering in deep level transient spectroscopy (DnLTS)
2. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
3. Improved feedback charge method for quasistatic CV measurements in semiconductors
4. Spectral Analysis of Deep Level Transient Spectroscopy (SADLTS)
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