Integration of GaN analog building blocks on p-GaN wafers for GaN ICs

Author:

Li Xiangdong,Geens Karen,Amirifar Nooshin,Zhao Ming,You Shuzhen,Posthuma Niels,Liang Hu,Groeseneken Guido,Decoutere Stefaan

Abstract

Abstract We demonstrate the key module of comparators in GaN ICs, based on resistor-transistor logic (RTL) on E-mode wafers in this work. The fundamental inverters in the comparator consist of a p-GaN gate HEMT and a 2DEG resistor as the load. The function of the RTL comparators is finally verified by a undervoltage lockout (UVLO) circuit. The compatibility of this circuit with the current p-GaN technology paves the way for integrating logic ICs together with the power devices.

Publisher

IOP Publishing

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. High-speed, high-reliability GaN power device with integrated gate driver;Tang;Proc ISPSD,2018

2. 200 V enhancement-mode p-GaN HEMTs fabricated on 200 mm GaN-on-SOI with trench isolation for monolithic integration;Li;IEEE Electron Device Lett,2017

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