Final report on Key Comparison K67 and parallel Pilot Study P108: Measurement of composition of a thin Fe

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Final report on Key Comparison K67 and parallel Pilot Study P108: Measurement of composition of a thin Fe–Ni alloy film

Published:2010-01 Issue:1A Volume:47 Page:08011-08011
ISSN:1681-7575
Container-title:Metrologia
language:
Short-container-title:Metrologia

Author:

Kim Kyung Joong,Kim Jeong Won,Moon Dae Won,Wirth Thomas,Hodoroaba Vasile-Dan,Gross Thomas,Unger Wolfgang E S,Jordaan Werner,Staden Martin Van,Prins Sara,Wang Hai,Song Xiaoping,Zhang Lulu,Fujimoto Toshiyuki,Kojima Isao

Publisher

IOP Publishing

Subject

General Engineering

Link

http://stacks.iop.org/0026-1394/47/i=1A/a=08011/pdf

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 試料の分析高さ位置の不確定性を除外したW-Si標準物質を用いたXPSスペクトルピークの相対強度比の測定精度;Journal of Surface Analysis;2023-08-07

2. The Surface Analysis Working Group at the Consultative Committee for Amount of Substance, Metrology in Chemistry and Biology : A successful initiative by Martin Seah;Surface and Interface Analysis;2021-11-07

3. Traceable quantitative analysis of Ag x Cu1−x alloy films by ID ICP-MS, RBS and MEIS;Metrologia;2021-10-25

4. International standardization and metrology as tools to address the comparability and reproducibility challenges in XPS measurements;Journal of Vacuum Science & Technology A;2020-03

5. Quantitative analysis of Si1-xGex alloy films by SIMS and XPS depth profiling using a reference material;Applied Surface Science;2018-02

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