The Surface Analysis Working Group at the Consultative Committee for Amount of Substance, Metrology in Chemistry and Biology : A successful initiative by Martin Seah-Reference-Cited by-同舟云学术

The Surface Analysis Working Group at the Consultative Committee for Amount of Substance, Metrology in Chemistry and Biology : A successful initiative by Martin Seah

Published:2021-11-07 Issue: Volume: Page:
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Unger Wolfgang E. S.¹²^ORCID,Fujimoto Toshiyuki³

Affiliation:

1. Bundesanstalt für Materialforschung und ‐prüfung (BAM) Berlin Germany

2. Alumni Network Humboldt University of Berlin Berlin Germany

3. National Metrology Institute of Japan (NMIJ) AIST Tsukuba Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/sia.7033

Reference28 articles.

1. Martin Seah: An extraordinary scientist and metrologist

2. Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis—determination of lateral resolution and sharpness in beam‐based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X‐ray photoelectron spectrometers (XPS);Unger WES;Surf Interface Anal,2021

3. ISO 18115 – 1.2013Surface chemical analysis—vocabulary—part 1: general terms and terms used in spectroscopy.

4. ISO 18115 – 2.2013Surface chemical analysis—vocabulary—part 2: terms used in scanning‐probe microscopy.

5. BIPMOur mission and objectives.https://www.bipm.org/en/mission-objectives

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1. TiN hard coating as a candidate reference material for surface metrology in chemistry: characterization and quantification by bulk and surface analyses techniques;Revista de Metalurgia;2022-12-27

2. Martin Seah: An Inspiring Leader in Surface Analysis;Journal of Surface Analysis;2022-03-09