1. [ 1] 表面分析―基礎と応用〈上巻〉, D. Briggs, M.P. Seah, 志水 隆一, 合志 陽一, 表面分析研究会, アグネ承風社 (1990).
2. [ 2] D. R. Baer, G. E. McGuire, K. Artyushkova, C. D. Easton, M. H. Engelhard, and A. G. Shard, J. Vac. Sci. Technol. A 39, 021601(2021).
3. [ 3] K. J. Kim, J. W. Kim, D. W. Moon, T. Wirth, V.-D. Hodoroaba, T. Gross, W. E. S. Unger, W. Jordaan, M. Van Staden, S. Prins, H. Wang, X. Song, L. Zhang, T. Fujimoto and I. Kojima, Metrologia 47, 08011(2010).
4. [ 4] W. E. S. Unger, J. Vac. Sci. Technol. A 38, 021201(2020).
5. [ 5] ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials.