Traceable quantitative analysis of Ag
x
Cu1−x
alloy films by ID ICP-MS, RBS and MEIS
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Published:2021-10-25
Issue:6
Volume:58
Page:065004
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ISSN:0026-1394
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Container-title:Metrologia
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language:
-
Short-container-title:Metrologia
Author:
Kim Tae GunORCID,
Heo Sung WooORCID,
Min Won Ja,
Han Tae-Hun,
Yim Yong-Hyeon,
Yu Hyunung,
Kim Kyung JoongORCID
Subject
General Engineering
Cited by
1 articles.
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