Author:
Jalabert D,Curé Y,Hestroffer K,Niquet Y M,Daudin B
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering
Cited by
8 articles.
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1. Recent advances in MEIS;Surface and Interface Analysis;2019-11-28
2. Ion blocking dip shape analysis around a LaAlO3/SrTiO3 interface;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-05
3. Bibliography;Swift Ion Beam Analysis in Nanosciences;2017-08-25
4. Strain relaxation of CdTe on Ge studied by medium energy ion scattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-10
5. On the use of MEIS cartography for the determination of Si 1–x Ge x thin-film strain;Thin Solid Films;2016-07