A spectroscopic comparison of IGZO thin films and the parent In2O3, Ga2O3, and ZnO single crystals-Reference-Cited by-同舟云学术

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A spectroscopic comparison of IGZO thin films and the parent In2O3, Ga2O3, and ZnO single crystals

Published:2016-10-14 Issue:10 Volume:3 Page:106302
ISSN:2053-1591
Container-title:Materials Research Express
language:
Short-container-title:Mater. Res. Express

Author:

Haeberle J,Brizzi S,Gaspar D,Barquinha P,Galazka Z,Schulz D,Schmeißer D

Funder

Deutsche Forschungs-Gemeinschaft (DFG)

Publisher

IOP Publishing

Subject

Metals and Alloys,Polymers and Plastics,Surfaces, Coatings and Films,Biomaterials,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/2053-1591/3/i=10/a=106302/pdf

Reference38 articles.

1. Toward High-Performance Amorphous GIZO TFTs

2. The influence of fibril composition and dimension on the performance of paper gated oxide transistors

3. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors

4. The Effect of Deposition Conditions and Annealing on the Performance of High-Mobility GIZO TFTs

5. An amorphous oxide semiconductor thin-film transistor route to oxide electronics

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5. Deposition, Characterization, and Performance of Spinel InGaZnO₄;ACS Applied Electronic Materials;2022-02-23

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