The Roles of DNP (Distance to Neutral point) on Solder Joint Reliability of Area Array Assemblies

Author:

Lau J.H.

Abstract

The objective of this paper is to point out the limitations and ròles of DNP (distance to neutral point) on predicting the solder‐joint thermal‐fatigue life of area‐array assemblies.

Publisher

Emerald

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science,Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference12 articles.

1. 1Lau, J. H. and Pao, Y. ‐H., ‘Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies’, McGraw‐Hill, New York, NY (1997).

2. 2Lau, J. H., ‘Flip Chip Technologies’, McGraw‐Hill, New York, NY (1996).

3. 3 Lau, J. H., ‘Ball Grid Technology’, McGraw‐Hill, New York, NY (1995).

4. 4 Lau, J. H. ‘Chip On Board Technologies for Multichip Modules’, Van Nostrand Reinhold, New York, NY (1994).

5. 5 Lau, J. H., ‘Solder Joint Reliability, theory and Applications’, Van Nostrand Reinhold, New York, NY (1991).

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