Author:
Lena Eberle Anna,Schalek Richard,Lichtman Jeff W.,Malloy Matt,Thiel Brad,Zeidler Dirk
Publisher
Cambridge University Press (CUP)
Cited by
21 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Advancements in metrology for advanced semiconductor packaging;Optics and Photonics for Advanced Dimensional Metrology III;2024-06-18
2. Morphomics via next-generation electron microscopy;Journal of Molecular Cell Biology;2023-12-26
3. Electron Microscopy Studies of Soft Nanomaterials;Chemical Reviews;2023-01-17
4. 先进节点图案化晶圆缺陷检测技术;Laser & Optoelectronics Progress;2023
5. Remote Instrumentation Science Environment for Intelligent Image Analytics;2022 IEEE 18th International Conference on e-Science (e-Science);2022-10