Electron Ptychography Using Fast Binary 4D STEM Data-Reference-Cited by-同舟云学术

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Electron Ptychography Using Fast Binary 4D STEM Data

Published:2019-08 Issue:S2 Volume:25 Page:1662-1663
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

O'Leary Colum M.,Liberti Emanuela,Collins Sean M.,Johnstone Duncan N.,Rothmann Mathias,Hou Jingwei,Allen Christopher S.,Kim Judy S.,Bennett Thomas D.,Midgley Paul A.,Kirkland Angus I.,Nellist Peter D.

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference7 articles.

1. The financial support of JEOL (UK) Ltd. and the EPSRC is gratefully acknowledged.

2. Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

3. Experimental tests on double-resolution coherent imaging via STEM

4. Electron ptychography of 2D materials to deep sub-ångström resolution

5. Use of a hybrid silicon pixel (Medipix) detector as a STEM detector

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Notes and References;Principles of Electron Optics, Volume 3;2022

2. Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector;Microscopy and Microanalysis;2020-07-30

3. Focused-probe STEM Ptychography: Developments and Opportunities;Microscopy and Microanalysis;2020-07-30

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