Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution-Reference-Cited by-同舟云学术

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Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

Published:2015-04 Issue: Volume:151 Page:160-167
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Pennycook Timothy J.^ORCID,Lupini Andrew R.,Yang Hao,Murfitt Matthew F.,Jones Lewys,Nellist Peter D.

Funder

EPSRC through the UK National Facility for Aberration-Corrected STEM (SuperSTEM)

EPSRC

Division of Materials Sciences and Engineering of the U.S. department of Energy

European Union Seventh Framework Programme

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. The potential and limitations of neutrons, electrons and X-rays for atomic-resolution microscopy of unstained biological molecules;Henderson;Q. Rev. Biophys.,1995

2. The theoretical resolution limit of the electron microscope;Scherzer;J. Appl. Phys.,1949

3. Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopy;Urban;Philos. Trans. R. Soc. A,2009

4. Invited review article;Glaeser;Rev. Sci. Instrum.,2013

5. Image contrast in a transmission scanning electron microscope;Cowley;Appl. Phys. Lett.,1969

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