Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector-Reference-Cited by-同舟云学术

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Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector

Published:2020-07-30 Issue:S2 Volume:26 Page:1944-1945
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Krajnak Matus,Blazit Jean-Denis,Zintler Alexander,Eilhardt Robert,Weiss Jon,Cosart Doug,Molina-Luna Leopoldo,Tencé Marcel,Gloter Alexandre,Allen Christopher,McGrouther Damien

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Reference4 articles.

1. Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast

2. Electron Ptychography Using Fast Binary 4D STEM Data

3. Interfacial Control of Magnetic Properties at LaMnO3/LaNiO3 Interfaces

4. Medipix2 as a highly flexible scanning/imaging detector for transmission electron microscopy

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural and Electrical Response of Emerging Memories Exposed to Heavy Ion Radiation;ACS Nano;2022-09-16

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