Electron ptychography of 2D materials to deep sub-ångström resolution-Reference-Cited by-同舟云学术

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Electron ptychography of 2D materials to deep sub-ångström resolution

Published:2018-07 Issue:7714 Volume:559 Page:343-349
ISSN:0028-0836
Container-title:Nature
language:en
Short-container-title:Nature

Author:

Jiang Yi,Chen Zhen,Han Yimo,Deb Pratiti,Gao Hui,Xie Saien,Purohit Prafull,Tate Mark W.,Park Jiwoong,Gruner Sol M.,Elser Veit,Muller David A.

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/s41586-018-0298-5.pdf

Reference54 articles.

1. Meyer, J. C., Girit, C. O., Crommie, M. F. & Zettl, A. Imaging and dynamics of light atoms and molecules on graphene. Nature 454, 319–322 (2008).

2. Krivanek, O. L. et al. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy. Nature 464, 571–574 (2010).

3. Huang, P. Y. et al. Grains and grain boundaries in single-layer graphene atomic patchwork quilts. Nature 469, 389–392 (2011).

4. Sparrow, C. M. On spectroscopic resolving power. Astrophys. J. 44, 76–86 (1916).

5. Black, G. & Linfoot, E. H. Spherical aberration and the information content of optical images. Proc. R. Soc. Lond. A 239, 522–540 (1957).

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