Author:
Krivanek Ondrej L.,Chisholm Matthew F.,Nicolosi Valeria,Pennycook Timothy J.,Corbin George J.,Dellby Niklas,Murfitt Matthew F.,Own Christopher S.,Szilagyi Zoltan S.,Oxley Mark P.,Pantelides Sokrates T.,Pennycook Stephen J.
Publisher
Springer Science and Business Media LLC
Reference28 articles.
1. Feynman, R. P. in Feynman and Computation (ed. Hey, J. G.) 63–76 (Perseus Press, Cambridge, Massachusetts, 1999); text of original 1959 lecture also available at 〈
http://feynman.caltech.edu/plenty.html
〉 (2001)
2. Haider, M. et al. Electron microscopy image enhanced. Nature 392, 768–769 (1998)
3. Batson, P. E., Dellby, N. & Krivanek, O. L. Sub-ångstrom resolution using aberration corrected electron optics. Nature 418, 617–620 (2002)
4. Hawkes, P. W. ed. Aberration-Corrected Electron Microscopy (Advances in Imaging and Electron Physics, Vol. 153, Elsevier, 2008)
5. Girit, Ç. Ö. et al. Graphene at the edge: stability and dynamics. Science 323, 1705–1708 (2009)
Cited by
1164 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献