[Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor-Reference-Cited by-同舟云学术

[Papers] Statistical Analyses of Random Telegraph Noise in Pixel Source Follower with Various Gate Shapes in CMOS Image Sensor

Published:2018 Issue:3 Volume:6 Page:163-170
ISSN:2186-7364
Container-title:ITE Transactions on Media Technology and Applications
language:en
Short-container-title:MTA

Author:

Ichino Shinya¹,Mawaki Takezo¹,Teramoto Akinobu²,Kuroda Rihito¹,Wakashima Shunichi¹,Suwa Tomoyuki²,Sugawa Shigetoshi¹²

Affiliation:

1. Graduate School of Engineering, Tohoku University

2. New Industry Creation Hatchery Center, Tohoku University

Publisher

Institute of Image Information and Television Engineers

Subject

Computer Graphics and Computer-Aided Design,Media Technology,Signal Processing

Link

https://www.jstage.jst.go.jp/article/mta/6/3/6_163/_pdf

Reference37 articles.

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2. 2) C. Leyris, F. Martinez, M. Valenza, A. Hoffmann, J.C. Vildeuil and F. Roy: "Impact of Random Telegraph Signal in CMOS Image Sensors for Low-Light Levels", Solid State Circuits Conf., pp.376-379 (2006)

3. 3) X. Wang, P.R. Rao, A. Mierop and A.J. P. Theuwissen: "Random Telegraph Signal in CMOS Image Sensor Pixels", IEDM Tech. Dig., pp.115-118 (2006)

4. 4) J.Y. Kim, S.I. Hwang, J.J. Lee, J.H. Ko, Y. Kim, J.C. Ahn, T. Asaba and Y.H. Lee: "Characterization and improvement of random noise in 1/3.2" UXGA CMOS image sensor with 2.8um pixel using 0.13um-technology", IEEE Work. CCDs AIS. Japan, pp.149-152 (2005)

5. 5) X. Wang, M.F. Snoeij, P.R. Rao, A. Mierop and A.J. P. Theuwissen: "A CMOS Image Sensor with a Buried-Channel Source Follower", Int. Solid-State Circuits Conf., pp.62-64 (2008)

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