On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude-Reference-Cited by-同舟云学术

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On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude

Published:2021 Issue: Volume:9 Page:43551-43561
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Mehedi Mehzabeen,Tok Kean Hong,Ye Zengliang,Zhang Jian Fu,Ji Zhigang,Zhang Weidong,Marsland John S.

Funder

Engineering and Physical Science Research Council of U.K

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/9312710/09378510.pdf?arnumber=9378510

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps;2023 IEEE 15th International Conference on ASIC (ASICON);2023-10-24

2. Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors;IEEE Transactions on Device and Materials Reliability;2023-09

3. Characterizing and Modeling RTN Under Real Circuit Bias Conditions;IEEE Transactions on Electron Devices;2023-05

4. Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

5. Criteria for selecting statistical distribution for the Amplitude of Random Telegraph Noise;2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT);2022-10-25

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