Criteria for selecting statistical distribution for the Amplitude of Random Telegraph Noise
Author:
Affiliation:
1. Liverpool John Moores University,School of Engineering,Liverpool,UK,L3 3AF
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9962815/9963138/09963221.pdf?arnumber=9963221
Reference19 articles.
1. Trigger-When-Charged: A Technique for Directly Measuring RTN and BTI-Induced Threshold Voltage Fluctuation Under Use- ${V}_{dd}$
2. As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction
3. Reliable Time Exponents for Long Term Prediction of Negative Bias Temperature Instability by Extrapolation
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1. Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors;IEEE Transactions on Device and Materials Reliability;2023-09
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