Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability-Reference-Cited by-同舟云学术

Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability

Published:2023-03 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE International Reliability Physics Symposium (IRPS)
language:
Short-container-title:

Author:

Martin-Martinez Javier¹,Diaz-Fortuny Javier¹,Saraza-Canflanca Pablo²,Rodriguez Rosana¹,Castro-Lopez Rafael²,Roca Elisenda²,Fernandez Francisco V.²,Nafria Montserrat¹

Affiliation:

1. Universitat Autonoma Barcelona,Department of Electronic Engineering,Bellaterra,Spain,08193

2. Instituto de Microelectrónica de Sevilla, (Universidad de Sevilla and CSIC),Seville,Spain,41092

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10117589/10117581/10118334.pdf?arnumber=10118334

Reference38 articles.

1. A Comparative Study of Different Physics-Based NBTI Models

2. Defect-centric perspective of combined BTI and RTN time-dependent variability

3. A unified perspective of RTN and BTI

4. Determination of the Time Constant Distribution of a Defect-Centric Time-Dependent Variability Model for Sub-100-nm FETs

5. Predictive Hot-Carrier Modeling of n-Channel MOSFETs

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-Throughput Addressable Test Structure Design for Nano-Scaled CMOS Device Characterization;IEEE Transactions on Circuits and Systems II: Express Briefs;2024-09

2. Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14