Height distribution of atomic force microscopy images as a tool for atomic layer deposition characterization-Reference-Cited by-同舟云学术

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Height distribution of atomic force microscopy images as a tool for atomic layer deposition characterization

Published:2013-01 Issue:1 Volume:31 Page:01A104
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Kolanek Krzysztof,Tallarida Massimo,Schmeisser Dieter

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4754557

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