Process dependence of roughness in a positive-tone chemically amplified resist-Reference-Cited by-同舟云学术

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Process dependence of roughness in a positive-tone chemically amplified resist

Published:1998-11 Issue:6 Volume:16 Page:3748
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:
Short-container-title:J. Vac. Sci. Technol. B

Author:

He D.

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 102 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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