Author:
Abderrahman A.,Kaminska B.,Cerny E.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference13 articles.
1. Semiconductor Industry Technology Workshop Conclusions, Semiconductor Industry Association, 1993.
2. L. Milor and V. Visvanathan, ?Detection of catastrophic faults in analog integrated circuits,? IEEE Trans. Computer-Aided Design, Vol. 8, pp. 114?130, Feb. 1989.
3. L. Milor and A. Sangiovanni-Vincentelli, ?Optimal Test Set Design for Analog Circuits,? Proc. ICCAD, 1990, pp. 294?297.
4. L. Milor and A. Sangiovanni-Vincentelli, ?Minimizing Production Test Time to Detect Faults in Analog Circuits,? IEEE trans. Computer-Aided Design, Vol. 13, No. 6, pp. 796?813, June 1994.
5. S.-J. Tsai, ?Test Vector Generation for Linear Analog Devices,? Proc. IEEE International Test Conference, 1990, pp. 592?597.
Cited by
31 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献