Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances-Reference-Cited by-同舟云学术

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Analog Circuit Test Point Selection Incorporating Discretization-Based Fuzzification and Extended Fault Dictionary to Handle Component Tolerances

Published:2016-11-08 Issue:6 Volume:32 Page:661-679
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Cui Yiqian,Shi Junyou,Wang Zili

Funder

Technology Foundation Program of National Defense

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-016-5620-2.pdf

Reference35 articles.

1. Abderrahman A, Kaminska B, Cerny E (1996) Optimization-based multifrequency test generation for analog circuits. J Electron Test 9:59–73

2. Bilski P, Wojciechowski JM (2007) Automated diagnostics of analog systems using fuzzy logic approach. IEEE Trans Instrum Meas 56:2175–2185

3. Catelani M, Fort A, Alippi C (2002) A fuzzy approach for soft fault detection in analog circuits. Measurement 32:73–83

4. Chang YH (2002) Frequency–domain grouping robust fault diagnosis for analog circuits with uncertainties. Int J Circuit Theory Applications 30:65–86

5. Cui Y, Shi J, Wang Z (2015) An analytical model of electronic fault diagnosis on extension of the dependency theory. Reliab Eng Syst Saf 133:192–202

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1. Soft fault diagnosis in linear circuits: Test selection and non-iterative identification procedure;Measurement;2023-08

2. Novel testability modelling and diagnosis method considering the supporting relation between faults and tests;Microelectronics Reliability;2022-02

3. System level test selection based on combinatorial dependency matrix;Journal of Systems Engineering and Electronics;2021-08

4. A Combined Method for Analog Circuit Fault Diagnosis Based on Dependence Matrices and Intelligent Classifiers;IEEE Transactions on Instrumentation and Measurement;2020-03

5. Data-Driven Feature Extraction for Analog Circuit Fault Diagnosis Using 1-D Convolutional Neural Network;IEEE Access;2020

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