Detection of catastrophic faults in analog integrated circuits-Reference-Cited by-同舟云学术

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Detection of catastrophic faults in analog integrated circuits

Published:1989 Issue:2 Volume:8 Page:114-130
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Milor L.,Visvanathan V.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx1/43/882/00021830.pdf?arnumber=21830

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