Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis

Abstract

By simplifying tolerance problem and treating faulty voltages on different test points as independent variables, integer-coded table technique is proposed to simplify the test point selection process. Usually, simplifying tolerance problem may induce a wrong solution while the independence assumption will result in over conservative result. To address these problems, the tolerance problem is thoroughly considered in this paper, and dependency relationship between different test points is considered at the same time. A heuristic graph search method is proposed to facilitate the test point selection process. First, the information theoretic concept of entropy is used to evaluate the optimality of test point. The entropy is calculated by using the ambiguous sets and faulty voltage distribution, determined by component tolerance. Second, the selected optimal test point is used to expand current graph node by using dependence relationship between the test point and graph node. Simulated results indicate that the proposed method more accurately finds the optimal set of test points than other methods; therefore, it is a good solution to minimize the size of the test point set. To simplify and clarify the proposed method, only catastrophic and some specific parametric faults are discussed in this paper.