LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits
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Publisher
Springer Singapore
Link
http://link.springer.com/content/pdf/10.1007/978-981-10-7470-7_44
Reference19 articles.
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3. Panagopoulos, G.D., Roy, K.: A three-dimensional physical model for $$V_{th}$$ variations considering the combined effect of NBTI and RDF. IEEE Trans. Electron Devices 58(8), 2337–2346 (2011)
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