Mitigating the thermally induced single event crosstalk
Author:
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Link
http://link.springer.com/article/10.1007/s10470-017-0992-5/fulltext.html
Reference17 articles.
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2. Balasubramanian, A., Sternberg, A. L., Bhuva, B. L., & Massengill, L. W. (2006). Crosstalk effects caused by single event hits in deep sub-micron CMOS technologies. IEEE Transactions on Nuclear Science, 53(6), 3306–3311.
3. Sayil, S., Akkur, A. B., & Gaspard, N. (2009). Single event crosstalk shielding for CMOS logic. Microelectronics Journal, 40(6), 1000–1006.
4. Normand, E. (1996). Single-event effects in avionics. IEEE Transactions on Nuclear Science, 43(2), 461–474.
5. Bradley, P. D., & Normand, E. (2004). Single event upset in implantable cardioverter defibrillators. IEEE Transactions on Nuclear Science, 45(6), 2929–2940.
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