Author:
He Chengming,Dai Xin,Xing Hanqing,Chen Degang
Publisher
Springer Science and Business Media LLC
Subject
Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing
Reference10 articles.
1. V. Gupta and G.A. Rincon-Mora, “Predicting the effects of error sources in bandgap reference circuits and evaluating their design implications.” Circuits Systems, 2002, MWSCAS-2002, vol. 3, pp. 575–578, Aug. 2002.
2. H.A. Alzaher and M. Ismail, “Robust low-distortion wideband CMOS current-follower.” Electronics Letters, vol. 35, no. 25, pp. 2203–2204, Dec. 1999.
3. S. Lovett, M. Welten, A. Mathewson, and B. Mason, “Optimizing MOS transistor mismatch.” IEEE Journal of Solid-State Circuits, vol. 33, pp. 147–150, Jan. 1998.
4. M.J.M. Pelgrom, A.C.J. Duinmaijer, and A.P.G. Welbers, “Matching properties of MOS transistors.” IEEE Journal of Solid-State Circuits, vol. SC-24, pp 1433–1439, 1989.
5. K. Lakshmikumar, R. Hadaway, and M. Copeland, “Characterization and modeling of mismatch in MOS transistors for precision analog design.” IEEE J. Solid-State Circuits, vol. SC-21, pp. 1057–1066, 1986.
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