Characterisation and modeling of mismatch in MOS transistors for precision analog design-Reference-Cited by-同舟云学术

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Characterisation and modeling of mismatch in MOS transistors for precision analog design

Published:1986-12 Issue:6 Volume:21 Page:1057-1066
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:en
Short-container-title:IEEE J. Solid-State Circuits

Author:

Lakshmikumar K.R.,Hadaway R.A.,Copeland M.A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/22611/01052648.pdf?arnumber=1052648

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