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Piecewise linear second moment statistical simulation of ICs affected by non-linear statistical effects

  • Published:2009-06-08 Issue:9 Volume:38 Page:969-993
  • ISSN:0098-9886
  • Container-title:International Journal of Circuit Theory and Applications
  • language:en
  • Short-container-title:Int. J. Circ. Theor. Appl.

Author:

Biagetti Giorgio,Crippa Paolo,Curzi Alessandro,Orcioni Simone,Turchetti Claudio

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. A statistical methodology for the design of high-performance CMOS current-steering digital-to-analog converters;Crippa;IEEE Transaction on Computer-Aided Design Integrated Circuits Systems,2002

2. Current mirror layout strategies for enhancing matching performance;Lan;International Journal on Analog Integrated Circuits and Signal Processing,2001

3. Yield and matching implications for static RAM memory array sense-amplifier design;Lovett;IEEE Journal of Solid-State Circuits,2000

4. Device mismatch and tradeoffs in the design of analog circuits;Kinget;IEEE Journal of Solid-State Circuits,2005

5. A layout-based statistical modeling for the prediction of matching properties of MOS transistors;Conti;IEEE Transactions on Circuits Systems I,2002

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3. Dynamic behavioral modeling of nonlinear circuits using a novel recurrent neural network technique;International Journal of Circuit Theory and Applications;2019-04-17

4. From Microelectronics to Nanoelectronics: Fifty Years of Advancements in Electronics;The First Outstanding 50 Years of “Università Politecnica delle Marche”;2019

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