Design and analysis of a SET tolerant single-phase clocked double-tail dynamic comparator-Reference-Cited by-同舟云学术

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Design and analysis of a SET tolerant single-phase clocked double-tail dynamic comparator

Published:2022-06-11 Issue:2 Volume:112 Page:367-377
ISSN:0925-1030
Container-title:Analog Integrated Circuits and Signal Processing
language:en
Short-container-title:Analog Integr Circ Sig Process

Author:

Wu Hao,Jin Gang,Zhuang Yiqi

Funder

Overseas Expertise Introduction Project for Discipline Innovation

Publisher

Springer Science and Business Media LLC

Subject

Surfaces, Coatings and Films,Hardware and Architecture,Signal Processing

Link

https://link.springer.com/content/pdf/10.1007/s10470-022-02054-7.pdf

Reference22 articles.

1. Folla, J. K., Crespo, M. L., Wembe, E. T., Bhuiyan, M. A. S., Cicuttin, A., Essimbi, B. Z., & Reaz, M. B. I. (2020). A low-offset low-power and high-speed dynamic latch comparator with a preamplifier-enhanced stage. IET Circuits, Devices and Systems, 15, 65–77. https://doi.org/10.1049/cds2.12008

2. Ghasemian, H., Ghasemi, R., Abiri, E., & Salehi, M. R. (2019). A novel high-speed low-power dynamic comparator with complementary differential input in 65 nm CMOS technology. Microelectronics Journal, 92, 104603. https://doi.org/10.1016/j.mejo.2019.104603

3. Dodd, P. E., & Massengill, L. W. (2003). Basic mechanisms and modeling of single-event upset in digital microelectronics. IEEE Transactions on Nuclear Science, 50, 583–602. https://doi.org/10.1109/TNS.2003.813129

4. Krishna, V., Deb, S., & Sahoo, B. D. (2021). Rail-to-rail split-output SET tolerant digital gates. Analog Integrated Circuits and Signal Processing, 109, 225–239. https://doi.org/10.1007/s10470-021-01926-8

5. Hu, C., Chen, S., Huang, P., Liu, Y., & Chen, J. (2015). Evaluating the single event sensitivity of dynamic comparator in 5 Gbps SerDes. IEICE Electronics Express, 12, 20150860. https://doi.org/10.1587/elex.12.20150860

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1. Efficient Design of a Double Tail Dynamic Comparator for High Speed and Low Power Applications in 90nm Technology;2024 IEEE International Conference on Information Technology, Electronics and Intelligent Communication Systems (ICITEICS);2024-06-28

2. Spatiotemporal variation of the carbon footprint of tobacco production from 2004 to 2017 in China;Frontiers in Environmental Science;2024-04-18

3. A Single-Event Transient (SET) Tolerant Dynamic Bias Comparator in 65-nm CMOS;2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS);2023-08-06

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